Title :
A simple measurement method to determine the burst acquisition time of digital systems
Author :
Hatamoto, Curtis ; Fu, Huajing ; Feher, Kamilo
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
In certain applications, such as in the wireless field, the synchronization time is crucial to the transmission of data. For instance, in a frequency-hopping spread spectrum (FH-SS) system, the carrier frequency is constantly changing. The receiver must be able to resynchronize every time and the faster it can, the higher the effective data rate becomes. To maintain a high-quality transmission, this resynchronization time must be kept to a minimum. A cost-efficient solution for measuring fast and ultrafast synchronization-caused bit errors is disclosed. This invention enables the user to modify conventional test instruments and to eliminate the need to obtain very expensive test equipment. Our new instrumentation implementation concept comprises a gated switch added to a pseudorandom bit sequence generator and analyzer. The synchronization time of a couple of circuits is tested
Keywords :
binary sequences; coding errors; data communication; digital radio; error statistics; frequency hop communication; network analysis; signal generators; spread spectrum communication; synchronisation; FH-SS system; burst acquisition time; carrier frequency; data rate; data transmission; digital systems; fast synchronization bit errors; frequency-hopping spread spectrum system; gated switch; measurement method; pseudorandom bit sequence analyzer; pseudorandom bit sequence generator; receiver; resynchronization time; synchronization time; test instruments; ultrafast synchronization bit errors; Bit error rate; Circuit testing; Clocks; Data analysis; Digital systems; Frequency synchronization; Instruments; Signal to noise ratio; Switches; Time measurement;
Conference_Titel :
Communications, 1996. ICC '96, Conference Record, Converging Technologies for Tomorrow's Applications. 1996 IEEE International Conference on
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-3250-4
DOI :
10.1109/ICC.1996.541270