• DocumentCode
    3023782
  • Title

    Numerical modeling and design of Pnp InAlAs-InGaAs heterojunction bipolar transistors

  • Author

    Datta, S. ; Shi, S. ; Roenker, K.P. ; Cahay, M.M. ; Stanchina, William E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    Pnp InAlAs/InGaAs heterojunction bipolar transistors have been studied using a two dimensional, numerical approach based on a commercial simulator. Initial simulation results have shown good agreement with the available experimental data. This paper examines the effects of the epitaxial layer parameters and optimization of the transistor´s multi-layer epitaxial structure. Due to the small hole diffusion length, base widths approaching 30 nm are needed to achieve significant current gain (>100) and large fτ (>10 GHz). The high majority carrier electron mobility in the base allows the base resistance to remain small as the base width and doping are reduced so that an fτ greater than 20 GHz and an fmax greater than 30 GHz are possible
  • Keywords
    III-V semiconductors; aluminium compounds; carrier lifetime; electron mobility; gallium arsenide; heterojunction bipolar transistors; hole mobility; indium compounds; microwave bipolar transistors; semiconductor device models; semiconductor doping; semiconductor epitaxial layers; 10 to 20 GHz; 30 GHz; 30 nm; InAlAs-InGaAs; InP; Pnp InAlAs/InGaAs heterojunction bipolar transistors; base resistance; base width; base widths; collector doping; commercial simulator; current gain; cutoff frequency; design; doping reduction; epitaxial layer parameters; frequency of oscillation; hole diffusion length; majority carrier electron mobility; multi-layer epitaxial structure optimization; numerical modeling; two dimensional numerical approach; Computational modeling; Current density; Doping; Effective mass; Frequency; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Numerical models; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600176
  • Filename
    600176