Title :
Numerical modeling and design of Pnp InAlAs-InGaAs heterojunction bipolar transistors
Author :
Datta, S. ; Shi, S. ; Roenker, K.P. ; Cahay, M.M. ; Stanchina, William E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
Abstract :
Pnp InAlAs/InGaAs heterojunction bipolar transistors have been studied using a two dimensional, numerical approach based on a commercial simulator. Initial simulation results have shown good agreement with the available experimental data. This paper examines the effects of the epitaxial layer parameters and optimization of the transistor´s multi-layer epitaxial structure. Due to the small hole diffusion length, base widths approaching 30 nm are needed to achieve significant current gain (>100) and large fτ (>10 GHz). The high majority carrier electron mobility in the base allows the base resistance to remain small as the base width and doping are reduced so that an fτ greater than 20 GHz and an fmax greater than 30 GHz are possible
Keywords :
III-V semiconductors; aluminium compounds; carrier lifetime; electron mobility; gallium arsenide; heterojunction bipolar transistors; hole mobility; indium compounds; microwave bipolar transistors; semiconductor device models; semiconductor doping; semiconductor epitaxial layers; 10 to 20 GHz; 30 GHz; 30 nm; InAlAs-InGaAs; InP; Pnp InAlAs/InGaAs heterojunction bipolar transistors; base resistance; base width; base widths; collector doping; commercial simulator; current gain; cutoff frequency; design; doping reduction; epitaxial layer parameters; frequency of oscillation; hole diffusion length; majority carrier electron mobility; multi-layer epitaxial structure optimization; numerical modeling; two dimensional numerical approach; Computational modeling; Current density; Doping; Effective mass; Frequency; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Numerical models; Semiconductor process modeling;
Conference_Titel :
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location :
Cape Cod, MA
Print_ISBN :
0-7803-3898-7
DOI :
10.1109/ICIPRM.1997.600176