Title :
Logic design considerations for 0.5-volt CMOS
Author :
Hass, K. Joseph ; Venbrux, Jack ; Bhatia, Prakash
Author_Institution :
New Mexico Univ., Albuquerque, NM, USA
Abstract :
As the operation supply voltage for commercial CMOS devices falls below 2 V, research activities are underway to develop CMOS integrated circuits that can operate at supply voltages well under 1 V. Although dramatic power reductions can be achieved using low supply voltages in high performance applications, the increased subthreshold leakage that results when transistor threshold voltages are lowered can render some conventional logic circuit systems unusable. Furthermore, some low voltage circuits are not robust when faced with normal variations in threshold voltage. This paper examines the design consideration for logic and memory circuits in very low voltage CMOS and compares simulated behavior with measurements of fabrication test circuits. These circuit examples were closed because they illustrate the unique design challenges of low voltage CMOS
Keywords :
CMOS logic circuits; circuit simulation; integrated circuit design; leakage currents; logic simulation; low-power electronics; 0.5 V; CMOS; fabrication test circuits; low voltage circuits; operation supply voltage; simulated behavior; subthreshold leakage; supply voltages; transistor threshold voltages; CMOS integrated circuits; CMOS logic circuits; CMOS memory circuits; Circuit testing; Logic circuits; Logic design; Logic testing; Low voltage; Subthreshold current; Threshold voltage;
Conference_Titel :
Advanced Research in VLSI, 2001. ARVLSI 2001. Proceedings. 2001 Conference on
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7695-1038-8
DOI :
10.1109/ARVLSI.2001.915552