Title :
Identification of soft error glitch-propagation paths: Leveraging SAT solvers
Author :
Hamad, Ghaith Bany ; Ait Mohamed, Otmane ; Hasan, Syed Rafay ; Savaria, Yvon
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Abstract :
Increase in vulnerability to soft errors has affected the reliability of both synchronous and asynchronous circuits implemented in modern deep sub-micron technologies. Hence in such circuits, there is a growing need to identify the soft error glitch propagation possibility at an early stage in the design flow. This paper proposes a new methodology to obtain soft error glitch propagation paths in digital designs (both synchronous and asynchronous). To compute these paths, Multiway Decision Graphs (MDGs) and glitch-propagation sets (GP sets) are utilized in conjunction with Boolean Satisfiability solvers (MiniSat). The applicability of the proposed method is illustrated by implementing ISCAS89 benchmark sequential circuits, 8-bit adders, multipliers, and the Self-timed multiple-group pipeline asynchronous handshake circuits. The proposed SAT based methodology is on average 13 times faster than the best contemporary state-of-the-art techniques exhaustively analyze possible soft error glitch-propagation paths.
Keywords :
adders; asynchronous circuits; benchmark testing; circuit reliability; circuit testing; multiplying circuits; 8-bit adders; Boolean satisfiability solvers; ISCAS89 benchmark sequential circuits; SAT solvers; asynchronous circuits; deep sub-micron technologies; design flow; multipliers; multiway decision graphs; reliability; self-timed multiple-group pipeline asynchronous handshake circuits; soft error glitch-propagation paths; state-of-the-art techniques; vulnerability; Asynchronous circuits; Boolean functions; Circuit faults; Data structures; Integrated circuit modeling; Logic gates; Radiation detectors;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6272020