DocumentCode :
3024526
Title :
Effect of solution concentration on the morphology, electrical, and optical properties of MEH-PPV thin films
Author :
Shariffudin, S.S. ; Abidin, Nurhafizah Zainal ; Yahya, Nurul Zayana ; Aziz, Aznita Abdul ; Herman, Sukreen Hana ; Rusop, M.
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2012
fDate :
19-21 Sept. 2012
Firstpage :
293
Lastpage :
297
Abstract :
Polymer and organic light-emitting diodes (OLEDs), photovoltaic cells and field effect transistor are being focused towards commercialization. Poly[2-methoxy-5-(2´-ethyl-hexyloxy)-1,4-phenylene vinylene]or known as MEH-PPV, have been extensively studied for OLED applications. In this study, MEH-PPV powders were dissolved in toluene and 1, 2-dichlorobenzene (1, 2-DCB) at different solutions concentration and deposited using spin coating technique. Surface morphologies of the films were obtained using Atom Force Microscope (AFM) and thickness using surface profiler, while the electrical properties were investigated using 2-point probe. The optical properties were characterized using UV-Visible-NIR (UV-VIS-NIR), and photoluminescence (PL) spectrometer. The surface roughness, Ra of the films increased with the concentration for both types of solvent, however for films in toluene, as the concentration increased above 5mlmg-1, the roughness decreased which is caused by the aggregation of the MEH-PPV. Films´ thicknesses increased as well as the resistivity for both types of solvents. However, for MEH-PPV thin films in 1, 2-DCB show better conductivity compared to toluene. PL spectra of films using toluene are red-shifted due to longer conjugation length, and also show higher intensity compared to films using 1,2 DCB.
Keywords :
infrared spectrometers; organic light emitting diodes; photoluminescence; polymer films; spin coating; surface morphology; surface roughness; ultraviolet spectrometers; visible spectrometers; 1, 2-dichlorobenzene; 2-point probe; MEH-PPV thin films; UV-Visible-NIR spectrometer; atomic force microscope; field effect transistor; organic light emitting diodes; photoluminescence spectrometer; photovoltaic cells; solution concentration; spin coating technique; surface morphologies; surface profiler; surface roughness; toluene; Conductivity; Optical films; Polymers; Solvents; Surface morphology; Surface treatment; Polymer (MEH-PPV); electrical properties; morphology; optical properties; solvents concentration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4673-2395-6
Electronic_ISBN :
978-1-4673-2394-9
Type :
conf
DOI :
10.1109/SMElec.2012.6417144
Filename :
6417144
Link To Document :
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