DocumentCode
302487
Title
A test paradigm for analog and mixed-signal circuits and systems
Author
Wang, Cheng-Ping ; Hatzopoulos, Alkis A. ; Wey, Chin-Long
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
3
fYear
1996
fDate
12-15 May 1996
Firstpage
194
Abstract
This paper presents a built-in self-test (BIST) paradigm for analog/mixed-signal circuits and systems. The BIST structure uses a virtual instrument to generate test inputs, to measure the output responses, and to compare the measured responses with the good ones in digital form. Thus, no real instrument is necessary
Keywords
analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; analog circuit; built-in self-test; mixed-signal circuit; virtual instrument; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Circuits and systems; Frequency measurement; Instruments; Semiconductor device measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-3073-0
Type
conf
DOI
10.1109/ISCAS.1996.541513
Filename
541513
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