Title :
The Standard S Control Chart with Run Rules
Author :
Huiquan, Ma ; Ying, Yu ; Cuiyi, Xiao ; Qing, Yun Xiao ; Ping, Liu Jian ; Xia, Li
Author_Institution :
HeBei Normal Univ. of Sci. & Technol., Qinhuangdao, China
Abstract :
The application of standard |s| control chart with two run rules in control of process variability is discussed in this paper. The control limits and average run length(ARL) are computed by the method of Markov chain. The results show that the standard |s| control chart with run rules has smaller ARL than the standard |s| control chart for all kinds of magnitudes of shifts. In the end, an example accompanied by simulation is used to illustrate that the chart with run rules is more sensitive to shifts in the process variability.
Keywords :
Markov processes; control charts; process control; Markov chain; average run length; process control; process variability; run rules; standard |S| control chart; Control charts; Covariance matrix; Gaussian distribution; Markov processes; Monitoring; Process control; process variability; sample generalized variance; standard control chart; unbiased estimate;
Conference_Titel :
Cryptography and Network Security, Data Mining and Knowledge Discovery, E-Commerce & Its Applications and Embedded Systems (CDEE), 2010 First ACIS International Symposium on
Conference_Location :
Qinhuangdao
Print_ISBN :
978-1-4244-9595-5
DOI :
10.1109/CDEE.2010.85
