Title :
Combining: an alternative for choosing between reject-first and accept-first classifiers
Author :
Mascarilla, Laurent ; Frélicot, Carl ; Zahzah, El-Hadi
Author_Institution :
Lab. d´´Inf. et d´´Imagerie Ind., Univ. de la Rochelle, France
Abstract :
In the general framework of pattern classification two reject strategies are identified. These classifiers are defined as a couple of labeling and hardening functions. In this paper the first stage of classifiers belonging to each strategy are used in turn and their results are combined with a Dempster-Shafer model to classify or reject patterns. Results on artificial data are provided
Keywords :
inference mechanisms; pattern classification; uncertainty handling; Dempster-Shafer model; accept-first classifiers; hardening function; labeling function; pattern classification; reject strategies; reject-first classifiers; uncertainty handling; Labeling; Mathematical model; Pattern classification; Pattern matching; Reliability theory; Testing; Uncertainty;
Conference_Titel :
Fuzzy Information Processing Society, 1999. NAFIPS. 18th International Conference of the North American
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5211-4
DOI :
10.1109/NAFIPS.1999.781693
