Title :
An AC-SA based Test Set Optimization method
Author :
Fu Xin ; Fu Shuai
Author_Institution :
Inf. Eng. Sch., Jinlin Bus. & Technol. Coll., Changchun, China
Abstract :
Nowadays fault diagnosis of circuits has been more and more difficult because of digital circuit integrity, and this paper present an optimization method based on ant colony algorithm and simulated annealing algorithm to deal with the problem of Test Set Optimization. Experiment results show that this method made a great effectively in achieving global optimal solution of test optimization selection problem.
Keywords :
ant colony optimisation; fault diagnosis; integrated circuit testing; logic testing; simulated annealing; AC-SA based test set optimization method; ant colony algorithm; digital circuit integrity; fault diagnosis; simulated annealing algorithm; test optimization selection problem; Annealing; Educational institutions; Fault detection; Genetics; Integrated circuits; Simulated annealing; ant colony algorithm; fault diagnosis; simulated annealing algorithm; test set optimization;
Conference_Titel :
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location :
Shengyang
Print_ISBN :
978-1-4799-2564-3
DOI :
10.1109/MEC.2013.6885335
