DocumentCode :
3025626
Title :
Micro Device for Mechanical Evaluation of Axi-symmetric Nanometric Samples: A Feasibility Study
Author :
Gómez, Jorge A. ; Márquez-Lucero, Alfredo
Author_Institution :
Centro de Investig. en Mater. Av., Chihuahua, Mexico
fYear :
2010
fDate :
18-25 July 2010
Firstpage :
195
Lastpage :
199
Abstract :
A device is introduced which are able to perform tension tests on nano materials, which works on the basis of a differential thermal dilatation of two of its components. This difference in dilatation is enough large to put the device in operation when it is heating inside a Transmission Electron Microscope and stretching axi-symetric nano samples until breaking. The feasibility to produce and utilize such device, for nano-mechanical tests inside a TEM, has been demonstrated. This devise present the following advantages. a) It works without using an internal electric current, which avoids parasite currents improving the quality of the TEM image. b) It is unnecessary to modify the original design of commercial equipments, because its geometry fits perfectly the standard sizes of microscope holders. c) Its cost may be very low making it practically disposable at each test.
Keywords :
mechanical testing; nanotubes; tensile strength; transmission electron microscopes; axi-symmetric nanometric samples; mechanical evaluation; micro device; nano materials; transmission electron microscope; Carbon; Force; Heating; Nanoscale devices; Silicon; Welding; Nanotubes; mechanical testing; microdevices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensor Device Technologies and Applications (SENSORDEVICES), 2010 First International Conference on
Conference_Location :
Venice
Print_ISBN :
978-1-4244-7474-5
Type :
conf
DOI :
10.1109/SENSORDEVICES.2010.43
Filename :
5632187
Link To Document :
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