DocumentCode :
3025773
Title :
A statistical model for the obstructed factory radio channel
Author :
Yegani, Parviz ; McGillem, C.D.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
1989
fDate :
27-30 Nov 1989
Firstpage :
1351
Abstract :
A statistical model based on experimental data is presented to characterize the multipath propagation medium in typical manufacturing environments. The statistical behavior of the medium is described by a time-varying impulse response which includes the distribution of the parameter of the channel such as the gain, the interarrival time, and the number of paths. The experimentally measured pulse responses of indoor factory radio channels were used to estimate the channel statistics. The interarrival times of the signals were modeled by the Weibull distribution. A model for the distribution of the number of signals was presented using the modified Beta distribution. Finally, for the data with no threshold at the receiver, a suitable model for the distribution of the gain coefficients is found to be the log-normal distribution. It is concluded that the proposed approach can be used to analyze the manufacturing environments
Keywords :
radiocommunication; radiowave propagation; statistical analysis; telecommunication channels; Weibull distribution; channel statistics; gain coefficients; indoor radio channel; interarrival time; log-normal distribution; manufacturing environments; modified Beta distribution; multipath propagation medium; obstructed factory radio channel; statistical model; time-varying impulse response; Clutter; Delay; Fading; Performance analysis; Production facilities; Pulse measurements; Radio transmitters; Statistics; Virtual manufacturing; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference and Exhibition 'Communications Technology for the 1990s and Beyond' (GLOBECOM), 1989. IEEE
Conference_Location :
Dallas, TX
Type :
conf
DOI :
10.1109/GLOCOM.1989.64172
Filename :
64172
Link To Document :
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