Charge collection efficiency measurement system based on Field Programmable Gate Array multipurpose card

A charge collection efficiency (CCE) measurement system has been developed for CCE measurement of semiconductor nuclear detector using a nuclear counting system interface to a PC for data acquisition. A Field Programmable Gate Array (FPGA) based multipurpose card used for system development due to analog digital converter (ADC) and multichannel analyzer (MCA) functions needed for data acquisition available on board. This multipurpose card also portable and can easily interfaced to a computer. A data acquisition of CCE measurement system namely CCE Measurement V.1.0 also developed using LabVIEW 8.6. The CCE measurement system developed is a user friendly measurement system as it contains detector information, experimental, analysis and documentation. So, measurement results can automatically prepared during system execution. A CCE measurement of CdZnTe semiconductor detector AMPTEK XR-100T-CZT exposed to Cs-137 with 10.45 μCi activity with an increasing operating voltage proved that this developed measurement system is functional and ready to use.