Title :
Hydrogen passivation of ribbon silicon-electronic properties and solar cell results
Author :
Hahn, G. ; Geiger, P. ; Fath, P. ; Bucher, E.
Author_Institution :
Dept. of Phys., Konstanz Univ., Germany
Abstract :
Hydrogen bulk passivation of crystal defects plays a major role during solar cell processing of multicrystalline ribbon silicon material. In this study, the authors concentrate on the diffusion and effusion kinetics of hydrogen in different ribbon silicon materials (RGS (Bayer AG), EFG (ASE), String Ribbon (Evergreen Solar)). Electronic properties like majority charge carrier mobility and concentration were investigated by temperature dependent Hall measurements. Deuterium profiles determined with the SIMS method reveal that the diffusion velocity is strongly linked with the interstitial oxygen concentration present in the different materials. Taking into account these results, a confirmed record high efficiency of 12.5% on Bayer RGS silicon (4 cm2) was achieved with an optimized hydrogen passivation step
Keywords :
carrier density; carrier mobility; crystal defects; elemental semiconductors; hydrogen; passivation; secondary ion mass spectra; semiconductor device measurement; semiconductor device testing; silicon; solar cells; 12.5 percent; SIMS method; deuterium profiles; diffusion kinetics; diffusion velocity; effusion kinetics; interstitial oxygen concentration; majority charge carrier concentration; majority charge carrier mobility; multicrystalline ribbon silicon material; optimized hydrogen passivation; solar cell processing; temperature dependent Hall measurements; Charge carrier mobility; Crystalline materials; Current measurement; Hydrogen; Kinetic theory; Passivation; Photovoltaic cells; Silicon; Temperature dependence; Temperature measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915762