DocumentCode :
3026711
Title :
Growth of Tl-containing III-V materials by gas-source molecular beam epitaxy
Author :
Antonell, M.J. ; Abernathy, C.R. ; Sher, A. ; Berding, M. ; van Schilfgaarde, M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Florida Univ., Gainesville, FL, USA
fYear :
1997
fDate :
11-15 May 1997
Firstpage :
444
Lastpage :
447
Abstract :
The synthesis of the Tl-V binaries and In-Tl-V alloys have been investigated using gas-source molecular beam epitaxy. With this approach, neither the binary nor ternary Tl-containing phosphides could be attained, with virtually all of the Tl present in the form of metallic droplets. While the Tl-As system was found to produce a compound, this phase was Tl rich with a Tl/As ratio ranging between 6/1 to 9/1. This phase was always accompanied by metallic Tl which oxidized rapidly upon exposure to air. Zinc blende InTlAs was synthesized, as determined by Auger electron spectroscopy, but exhibited compositional variations believed to be due to severe Tl surface segregation. The formation of both the Tl-As and In-Tl-As phases was found to be strongly dependent upon growth temperature. The Tl-Sb system also produced a Tl rich phase, with a composition of Sb2Tl7, as measured by electron microprobe analysis. Unlike the arsenides and phosphides, the Tl-Sb compound could be synthesized even at growth temperatures of 375°C. This phase was found to exist in a CsCl structure and was accompanied by metallic Sb rather than elemental Tl as for the arsenides
Keywords :
Auger effect; III-V semiconductors; chemical beam epitaxial growth; crystal structure; electron probe analysis; indium compounds; semiconductor growth; surface segregation; surface structure; thallium compounds; 325 to 525 C; Auger electron spectroscopy; CsCl structure; In-Tl-As phase; InTlAs; Sb2Tl7; Tl surface segregation; Tl-As; Tl-As system; Tl-Sb; Tl-Sb system; Tl-containing III-V materials; compositional variations; electron microprobe analysis; gas-source molecular beam epitaxy; growth temperature dependence; metallic droplets; surface morphology; zinc blende InTlAs; Electrons; III-V semiconductor materials; Indium phosphide; Lattices; Molecular beam epitaxial growth; Spectroscopy; Substrates; Temperature measurement; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location :
Cape Cod, MA
ISSN :
1092-8669
Print_ISBN :
0-7803-3898-7
Type :
conf
DOI :
10.1109/ICIPRM.1997.600189
Filename :
600189
Link To Document :
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