• DocumentCode
    3026797
  • Title

    Development of chip-size silicon solar cells

  • Author

    Mulligan, William P. ; Terao, Akira ; Smith, David D. ; Verlinden, Pierre J. ; Swanson, Richard M.

  • Author_Institution
    SunPower Corp., Sunnyvale, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    158
  • Lastpage
    163
  • Abstract
    SunPower is developing a novel 250-Sun concentrator module that, because of a compact nonimaging optics design, is very low profile and looks much like a conventional flat plate module. This “micro-concentrator” requires very small, “chip-size” solar cells, with approximate dimensions of 2.3×2.3 mm. The authors have adapted their all-back point-contact silicon solar cell technology to this application. This cell technology has several advantages over competing Ill-V technologies including lower cost, elimination of grid shading, and more tolerance of nonuniform and off-normal cell illumination due to all-backside carrier collection and texture, respectively. A major problem for such small silicon cells, however, is the efficiency loss due to the sawed edges of the cell. An “edge surface field” created by a through-wafer diffusion is one possible solution to the problem. Modeling and preliminary experimental results are presented
  • Keywords
    elemental semiconductors; point contacts; semiconductor device measurement; semiconductor device models; semiconductor device testing; silicon; solar cells; solar energy concentrators; 2.3 mm; Si; all-back point-contact solar cell technology; all-backside carrier collection; chip-size Si concentrating solar cells development; compact nonimaging optics design; edge surface field; efficiency loss; flat plate module; grid shading elimination; micro-concentrator; through-wafer diffusion; Coatings; Costs; Doping; Lenses; Lighting; Optical design; Optical sensors; Photovoltaic cells; Silicon; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915778
  • Filename
    915778