Title :
Statistical estimation of short-circuit power in VLSI circuits
Author :
Hill, Anthony M. ; Kang, Sung-Mo
Author_Institution :
Dept. of Electr. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
In this paper we propose a technique for the probabilistic estimation of short-circuit power in VLSI circuits. Our algorithm is based on the transition density model and provides accurate short-circuit power estimates within a few seconds for all benchmark circuits. Modeling of short-circuit power consumption is discussed along with its role in gate-sizing optimization
Keywords :
VLSI; circuit optimisation; integrated circuit modelling; parameter estimation; statistical analysis; VLSI circuit; gate-sizing optimization; probabilistic estimation; short-circuit power consumption; statistical algorithm; transition density model; Algorithm design and analysis; Batteries; Circuits; Delay; Energy consumption; High performance computing; Performance analysis; Power system modeling; Semiconductor device modeling; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.541911
