Title :
Correlated jitter sampling for jitter cancellation in pipelined TDC
Author :
Oh, Taehwan ; Venkatram, Hariprasath ; Guerber, Jon ; Moon, Un-Ku
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
In this paper, the Correlated Jitter Sampling (CJS) technique, which alleviates the jitter induced error from the time reference in pipelined Time-to-Digital Converter (TDC), is proposed. The auxiliary pipelined TDC is employed to remove the jitter induced error of the main pipelined TDC in the CJS technique. A 12b pipelined TDC adopting the CJS technique in the 1st time quantization stage is simulated to validate the proposed technique. Simulation results show that the TDC can achieve a flat SNDR performance of 70dB regardless of the jitter from time reference up to 25% jitter of 1TLSB in reference clock, which is the maximum error allowed within a designed redundancy range of the pipelined TDC.
Keywords :
circuit noise; circuit reliability; clocks; jitter; pipeline processing; redundancy; reference circuits; time-digital conversion; CJS technique; SNDR performance; auxiliary pipelined TDC; correlated jitter sampling; jitter cancellation; jitter induced error; pipelined time-to-digital converter; quantization stage; redundancy range; reference clock; time reference; Capacitors; Clocks; Jitter; Linearity; Quantization; Redundancy; Tin;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6272164