DocumentCode
3027732
Title
The influence of surface modification on optoelectronic properties of monocrystalline silicon solar cells
Author
Beltowska-Lehman, E. ; Swiatek, Z. ; Lipinski, M. ; Panek, P. ; Zdanowicz, T. ; Krok, F. ; Ciach, R.
Author_Institution
Inst. of Metall. & Mater. Sci., Polish Acad. of Sci., Krakow, Poland
fYear
2000
fDate
2000
Firstpage
331
Lastpage
334
Abstract
The porous silicon (PS) layers on the front surface of n+ /p monocrystalline, textured silicon solar cells were investigated with the aim to improve the performance of standard screen-printed silicon solar cells. The application of the PS layer is very promising because simultaneous, antireflection coating and surface passivation can be obtained in one chemical process. In this work the improvement of solar cell characteristics due to the formation of PS layer (by stain etching method) between the grid fingers has been demonstrated. Such a surface modification allows reduction of the effective reflectance to about 3% in a wavelength range of 400-1000 nm effecting in increase of short circuit current density (about 10%) and in efficiency of about 16%. The significant increase in the IR and UV ranges of wavelengths on the internal quantum efficiency has been observed. The structure of homogeneous PS layer were investigated using SEM, TEM, and AFM methods
Keywords
antireflection coatings; atomic force microscopy; elemental semiconductors; optical properties; passivation; porous semiconductors; reflectivity; scanning electron microscopy; short-circuit currents; silicon; solar cells; surface treatment; thick films; transmission electron microscopy; 400 to 1000 nm; AFM; IR range; SEM; Si; Si solar cells; TEM; UV range; antireflection coating; chemical process; front surface; homogeneous porous silicon layer; internal quantum efficiency; monocrystalline silicon solar cells; n+/p monocrystalline solar cells; optoelectronic properties; performance improvement; porous Si layers; porous silicon layers; reflectance; screen-printed silicon solar cells; short circuit current density; stain etching method; surface modification; surface passivation; textured silicon solar cells; Chemical processes; Coatings; Etching; Fingers; Passivation; Photovoltaic cells; Reflectivity; Silicon; Surface texture; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915830
Filename
915830
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