DocumentCode
3027907
Title
Fuzzy methods for automated inspection of food products
Author
Davidson, Valerie ; Chu, Terrence ; Ryks, Joanne
Author_Institution
Sch. of Eng., Guelph Univ., Ont., Canada
fYear
1999
fDate
36342
Firstpage
909
Lastpage
913
Abstract
Automated product inspection is of considerable interest to food manufacturers since human inspectors currently perform a substantial amount of on-line inspection. At a low-level of information processing, machine vision offers advantages of objective and consistent assessment. However machine vision systems are frequently used for grading and quality control. In these applications, it is necessary to integrate a number of physical features to make an inference about overall quality that is consistent with consumer judgements. The work presented in this paper focuses on quality assessment of chocolate chip cookies based solely on visual features. Digital images were used to define physical characteristics of cookies produced on a commercial bakery line. Consumers were asked to rate typical cookies on a line scale. A number of fuzzy systems were developed to make quality control decisions based on features extracted from digital images. Results from two fuzzy systems are compared to consumer results from a validation test
Keywords
automatic optical inspection; computer vision; feature extraction; food processing industry; fuzzy systems; quality control; automated inspection; chocolate chip cookies; commercial bakery line; consumer judgements; digital images; feature extraction; food manufacturers; food products; fuzzy methods; fuzzy systems; grading; inference; line scale; machine vision; quality assessment; quality control decision making; validation test; visual features; Digital images; Food manufacturing; Food products; Fuzzy systems; Humans; Information processing; Inspection; Machine vision; Quality assessment; Quality control;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Information Processing Society, 1999. NAFIPS. 18th International Conference of the North American
Conference_Location
New York, NY
Print_ISBN
0-7803-5211-4
Type
conf
DOI
10.1109/NAFIPS.1999.781826
Filename
781826
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