• DocumentCode
    3027992
  • Title

    Analysis of rear contacted solar cell structures for cost-effective processes and materials

  • Author

    Dicker, J. ; Sölter, J. ; Schumacher, J.O. ; Glunz, S.W. ; Warta, W.

  • Author_Institution
    Fraunhofer-Inst. fur Solare Energiesysteme, Freiburg, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    387
  • Lastpage
    390
  • Abstract
    The authors compare the limiting effects of high-efficiency rear contacted solar cells, screen-printed rear contacted solar cells and emitter-wrap-through solar cells for different cell thickness by means of numerical device simulation. For high diffusion lengths, the high-efficiency rear contacted cell and the emitter-wrap-through solar cell show a decreasing short circuit current density with decreasing cell thickness, whereas the screen-printed rear contact cell shows the reverse behavior due to a “pumping” effect of the floating emitter. The impact of the emitter sheet resistance in the via hole of the emitter-wrap-through cell on the illuminated IV-curve is investigated for illumination from the front and from the rear side. The presented analysis allows an optimization of rear contacted cells for application as high-efficiency and as low-cost structures
  • Keywords
    carrier lifetime; current density; electrical contacts; semiconductor device models; semiconductor-metal boundaries; solar cells; thick films; cell thickness; cost-effective materials; cost-effective processes; diffusion length; emitter sheet resistance; emitter-wrap-through solar cells; illuminated IV-curve; numerical device simulation; rear contacted solar cell structures; screen-printed rear contact solar cells; short circuit current density; solar cell optimization; Circuit simulation; Electronic switching systems; Geometry; Lighting; Numerical simulation; P-n junctions; Photovoltaic cells; Short circuit currents; Solar energy; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915847
  • Filename
    915847