The effect of correlated level shifting on noise performance in switched capacitor circuits

The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Split-CLS switched capacitor amplification circuit, and many of the conclusions in this paper are applicable to more general CLS architectures as well. A theoretical model for noise is developed and shown to be in good agreement with simulation. It is found that for practical design values, the size of the level-shifting capacitor only weakly influences noise performance.