• DocumentCode
    3028017
  • Title

    Thermal modifications of internal quantum efficiencies in the near IR [Si solar cells]

  • Author

    Kuznicki, Z.T. ; Ley, M.

  • Author_Institution
    Lab. de Phys. et Applications des Semi-cond., CNRS, Strasbourg, France
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    391
  • Lastpage
    394
  • Abstract
    A planar nanostructure inserted in the emitter of a Si solar cell modifies the photovoltaic (PV) conversion performance. In this paper, the authors report a large internal quantum efficiency (IQE) improvement in the near IR (>900 nm) for a series of multi-interface novel device (or MIND) solar cells. The IQE modification can result from increased IR absorption, band-gap narrowing and photogeneration involving thermal phonons and extrinsic energy levels due to post-implantation point defects under stress and might still be improved by an adequate thermal treatment. They show that the near IR modification changes with ambient temperature. This could be related to an evolution of the phonon energy distribution which increases the probability of carrier generation with the participation of phonons
  • Keywords
    elemental semiconductors; energy gap; energy states; heat treatment; phonons; point defects; semiconductor device measurement; semiconductor device testing; silicon; solar cells; thermodynamics; Si; Si solar cells; band-gap narrowing; carrier generation probability; extrinsic energy levels; internal quantum efficiencies; near IR modification; phonon energy distribution; phonon participation; photogeneration; photovoltaic conversion performance; planar nanostructure; post-implantation point defects; thermal modifications; thermal phonons; thermal treatment; Annealing; Atomic measurements; Ion implantation; Nanostructured materials; Phonons; Photovoltaic cells; Photovoltaic systems; Solar power generation; Surface treatment; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915848
  • Filename
    915848