DocumentCode
3028039
Title
Diffraction grating structures in solar cells
Author
Zaidi, Saleem H. ; Gee, James M. ; Ruby, Douglas S.
Author_Institution
Gratings Inc., Albuquerque, NM, USA
fYear
2000
fDate
2000
Firstpage
395
Lastpage
398
Abstract
Sub-wavelength periodic texturing (gratings) of crystalline-silicon (c-Si) surfaces for solar cell applications can be designed for maximizing optical absorption in thin c-Si films. The authors have investigated c-Si grating structures using rigorous modeling, hemispherical reflectance and internal quantum efficiency measurements. Model calculations predict almost ~100% energy coupling into obliquely propagating diffraction orders. By fabrication and optical characterization of a wide range of 1D and 2D c-Si grating structures, they have achieved broadband, low (~5%) reflectance without an antireflection film. By integrating grating structures into conventional solar cell designs, they have demonstrated short-circuit current density enhancements of 3.4 and 4.1 mA/cm2 for rectangular and triangular 1D grating structures compared to planar controls. The effective path length enhancements due to these gratings were 2.2 and 1.7, respectively. Optimized 2D gratings are expected to have even better performance
Keywords
diffraction gratings; elemental semiconductors; light absorption; semiconductor device measurement; semiconductor device models; semiconductor device testing; silicon; solar cells; surface texture; Si; antireflection film; c-Si solar cells; diffraction grating structures; effective path length; energy coupling; fabrication; hemispherical reflectance; internal quantum efficiency measurements; model calculations; optical absorption; optical characterization; short-circuit current density; sub-wavelength periodic texturing; Absorption; Crystallization; Diffraction gratings; Optical design; Optical diffraction; Optical films; Photovoltaic cells; Predictive models; Reflectivity; Surface texture;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915850
Filename
915850
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