DocumentCode :
3028298
Title :
Texture modeling using stochastic languages
Author :
Fu, K.S.
Author_Institution :
Purdue University, West Lafayette, Indiana
Volume :
2
fYear :
1979
fDate :
12-14 Dec. 1979
Firstpage :
60
Lastpage :
65
Keywords :
Distortion measurement; Layout; Noise measurement; Stochastic processes; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control including the Symposium on Adaptive Processes, 1979 18th IEEE Conference on
Conference_Location :
Fort Lauderdale, FL, USA
Type :
conf
DOI :
10.1109/CDC.1979.270138
Filename :
4046366
Link To Document :
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