DocumentCode :
3028314
Title :
(220)-oriented Cu(In,Ga)Se2-evidence that it may improve solar cell performance
Author :
Liao, DaHan ; Rockett, A.
Author_Institution :
Dept. of Mater. Sci. & Eng., Illinois Univ., Urbana, IL, USA
fYear :
2000
fDate :
2000
Firstpage :
446
Lastpage :
449
Abstract :
Recent solar cell results suggest that a (220) or (204) orientation of CIGS thin films may have unique and possibly superior properties. The authors have deposited high-quality epitaxial mixed (220) and (204)-oriented CIGS layers on GaAs (110). The surfaces consist of highly tilted terraces of large flat (112) facets alternating with rough (112) planes. Temperature-dependent Hall-effect shows up to a 20 fold decrease in carrier concentration relative to films grown with (112) and (002) orientations. Carrier compensation and other defects observed in the (002) and (112) oriented films was reduced without Na addition in the (220)/(204) films. Changes in the hole mobility were also observed. Theoretical modeling using the AMPS computer code suggests that such a change in carrier concentration could lead to improvements in device performances in sufficiently good devices, consistent with observations
Keywords :
carrier density; copper compounds; epitaxial growth; gallium compounds; hole mobility; indium compounds; semiconductor device measurement; semiconductor device models; semiconductor device testing; semiconductor epitaxial layers; semiconductor growth; solar cells; (220)-oriented Cu(In,Ga)Se2 solar cells; AMPS computer code; CIGS thin films; Cu(In Ga)Se2; carrier compensation; carrier concentration; computer simulation; device performance; hole mobility; photovoltaic performance; temperature-dependent Hall-effect; Atomic force microscopy; Epitaxial layers; Gallium arsenide; Material properties; Photovoltaic cells; Scanning electron microscopy; Substrates; Surface morphology; Temperature measurement; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.915865
Filename :
915865
Link To Document :
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