Title :
Micro-benchmarking Flash Memory File-System Wear Leveling and Garbage Collection: A Focus on Initial State Impact
Author :
Olivier, Philippe ; Boukhobza, Jalil ; Senn, Eric
Author_Institution :
Univ. Eur. de Bretagne, Brest, France
Abstract :
NAND flash memories are currently the de facto secondary storage technology in the embedded system domain thanks to their benefits mainly in terms of energy consumption, I/O performance, and data storage density. This Non-Volatile Memory (NVM) technology has even made substantial strides into enterprise storage systems. However, flash memories have particular constraints that are mainly the limited lifetime, the erase-before-write rule, and the write/erase operation granularity asymmetry. Those peculiarities are either handled in hardware, throughout a specific controller, or in software, with the help of a dedicated Flash File System (FFS). This paper presents a comprehensive study on the impact of different FFS implementations of wear leveling and garbage collection on flash memory performance and lifetime according to different initial states. This study is an attempt to push state-of-the-art work on FFSs by adding some flash memory specific features micro-benchmarking techniques.
Keywords :
NAND circuits; benchmark testing; flash memories; storage management; FFS; I/O performance; NAND flash memory; NVM technology; data storage density; embedded system; energy consumption; enterprise storage system; erase-before-write rule; flash memory file-system; flash memory lifetime; flash memory performance; garbage collection; initial state impact; microbenchmarking technique; nonvolatile memory technology; secondary storage technology; wear leveling; write-erase operation granularity asymmetry; Benchmark testing; File systems; Flash memory; Kernel; Linux; Nonvolatile memory; Standards; Benchmarking; Embedded Linux; File System; Garbage Collection; NAND Flash memory; Performance; Wear leveling;
Conference_Titel :
Computational Science and Engineering (CSE), 2012 IEEE 15th International Conference on
Conference_Location :
Nicosia
Print_ISBN :
978-1-4673-5165-2
Electronic_ISBN :
978-0-7695-4914-9
DOI :
10.1109/ICCSE.2012.67