DocumentCode :
3028470
Title :
Research on Method of Electronic Equipment Fault Prediction
Author :
Huang Yunlai ; Bai Hang ; Feng Jiwei ; Chen Junqiang
Author_Institution :
Unit 63981, PLA, Wuhan, China
fYear :
2013
fDate :
29-30 June 2013
Firstpage :
1080
Lastpage :
1085
Abstract :
As the new intelligent method was applied constantly to the fault predication field, the technology of fault predication has already become the key direction of electronic equipment support studies. On the basis of summarizing several kinds of more common fault predication method modernly, Support Vector Regression (SVR) was introduced. To avoid the blind establishment of the parameter, this study proposes intelligent genetic algorithms for optimizing the SVR´s parameters, then the SVR model which had been set up was apply to a type of electronic equipment fault prediction. Finally, we adopt the number of a set of equipment condition monitoring data to verify the SVR model. The experimental result demonstrated that SVR model can predict the radar fault effectively.
Keywords :
condition monitoring; electronic engineering computing; electronic equipment testing; fault diagnosis; genetic algorithms; regression analysis; support vector machines; SVR; electronic equipment fault prediction; electronic equipment support; equipment condition monitoring data; fault predication field; intelligent genetic algorithm; intelligent method; radar fault prediction; support vector regression; Automation; Manufacturing; Electronic equipment; Fault predication; Intelligent genetic algorithm; Support Vector Regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Manufacturing and Automation (ICDMA), 2013 Fourth International Conference on
Conference_Location :
Qingdao
Type :
conf
DOI :
10.1109/ICDMA.2013.254
Filename :
6598178
Link To Document :
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