• DocumentCode
    3028470
  • Title

    Research on Method of Electronic Equipment Fault Prediction

  • Author

    Huang Yunlai ; Bai Hang ; Feng Jiwei ; Chen Junqiang

  • Author_Institution
    Unit 63981, PLA, Wuhan, China
  • fYear
    2013
  • fDate
    29-30 June 2013
  • Firstpage
    1080
  • Lastpage
    1085
  • Abstract
    As the new intelligent method was applied constantly to the fault predication field, the technology of fault predication has already become the key direction of electronic equipment support studies. On the basis of summarizing several kinds of more common fault predication method modernly, Support Vector Regression (SVR) was introduced. To avoid the blind establishment of the parameter, this study proposes intelligent genetic algorithms for optimizing the SVR´s parameters, then the SVR model which had been set up was apply to a type of electronic equipment fault prediction. Finally, we adopt the number of a set of equipment condition monitoring data to verify the SVR model. The experimental result demonstrated that SVR model can predict the radar fault effectively.
  • Keywords
    condition monitoring; electronic engineering computing; electronic equipment testing; fault diagnosis; genetic algorithms; regression analysis; support vector machines; SVR; electronic equipment fault prediction; electronic equipment support; equipment condition monitoring data; fault predication field; intelligent genetic algorithm; intelligent method; radar fault prediction; support vector regression; Automation; Manufacturing; Electronic equipment; Fault predication; Intelligent genetic algorithm; Support Vector Regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital Manufacturing and Automation (ICDMA), 2013 Fourth International Conference on
  • Conference_Location
    Qingdao
  • Type

    conf

  • DOI
    10.1109/ICDMA.2013.254
  • Filename
    6598178