Advances in the spectral index method for optoelectronic design

Author

Sewell, P. ; Benson, T.M. ; Vukovic, A. ; Greedy, S. ; Kendall, P.C.

Author_Institution

Dept. of Electr. & Electron. Eng., Nottingham Univ., UK

fYear

1999

fDate

1999

Firstpage

137

Lastpage

138

Abstract

The spectral index (SI) approach can be applied for 3D problems. The SI approximation that the small field penetration into the air regions can be modelled by using a slightly larger rib geometry can be carried over to the 3D case. Obviously, this presupposes that any discontinuities primarily scatter into the substrate and not the air regions. A 2D variational boundary condition applied in the plane of the base of the rib when used in conjunction with a suitable decomposition of the field amplitudes on this plane, can be used to solve fully 3D rib circuit problems. The principal advantage of this approach is that it ultimately only requires solution of a small set of linear equations to completely determine the fields in the full structure. The SI method is a valuable analysis tool for the optoelectronics designer

Keywords

boundary-value problems; integrated optoelectronics; optical design techniques; optical waveguide theory; optical waveguides; rib waveguides; variational techniques; 2D variational boundary condition; 3D problems; SI approximation; analysis tool; discontinuities; field amplitudes; fully 3D rib circuit problems; linear equations; optoelectronic design; optoelectronics designer; rib geometry; small field penetration; spectral index approach; spectral index method; Couplers; Design engineering; Design methodology; Dielectric substrates; Geometrical optics; Geometry; Optical design; Optical design techniques; Optical waveguides; Waveguide theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks, 1999. International Conference on

Conference_Location

Kielce

Print_ISBN

0-7803-5637-3

Type

conf

DOI

10.1109/ICTON.1999.781868

Filename

781868