Title :
Simulation of infrared Doppler wavelength conversion in semiconductor layers
Author :
Scherbatko, Igor ; Nerukh, Alexander ; Yemelyanov, Konstantin
Author_Institution :
Tech. Univ. of Radio Electron., Kharkov, Ukraine
Abstract :
An excited semiconductor medium with a refractive index as a moving Bragg grating for optical wavelength conversion was used in this research. Time-domain models are used to investigate a double-Doppler wavelength conversion of an infrared 0.8 ps width optical pulse. In order to actually calculate the ultrafast electromagnetic transients, a time-domain Volterra integro-differential equation was used
Keywords :
Bragg gratings; high-speed optical techniques; integro-differential equations; optical films; optical frequency conversion; semiconductor thin films; time-domain analysis; wavelength division multiplexing; 0.8 ps; 1.5 mum; WDM communications; double-Doppler wavelength conversion; excited semiconductor medium; infrared Doppler wavelength conversion simulation; moving Bragg grating; optical wavelength conversion; ps width optical pulse; refractive index; semiconductor layers; time-domain Volterra integro-differential equation; time-domain models; ultrafast electromagnetic transients; Nonlinear optics; Optical filters; Optical mixing; Optical pulses; Optical pumping; Optical refraction; Optical scattering; Optical variables control; Optical wavelength conversion; Refractive index;
Conference_Titel :
Transparent Optical Networks, 1999. International Conference on
Conference_Location :
Kielce
Print_ISBN :
0-7803-5637-3
DOI :
10.1109/ICTON.1999.781872
