Research and design of data acquisition system in TD-LTE Wireless Integrated Testing Platform

Author

Chen, Fatang ; Ye, Jian ; Sun, Linqi

Author_Institution

Chongqing Key Lab. of Mobile Commun., Chongqing Univ. of Posts & Telecommun. (CQUPT), Chongqing, China

fYear

2011

fDate

26-28 July 2011

Firstpage

663

Lastpage

666

Abstract

Based on TD-LTE (TD-SCDMA Long Term Evolution) Integrated Testing Platform, data acquisition need to be completed between DSP and FPGA, a realizing scheme of downlink link processing in system is proposed, with which complete the design and verification of the McBSP (Multichannel Buffered Serial Port) interface in the FPGA chip of series Virtex 5. The scheme has been used in TD-LTE wireless integrated testing instruments to complete large-capacity uplink data acquisition, meet the requirements of TD-LTE test in terms of processing speed and data accuracy.

Keywords

Long Term Evolution; code division multiple access; data acquisition; digital signal processing chips; field programmable gate arrays; radio links; time division multiple access; DSP; FPGA; TD-LTE wireless integrated testing platform; TD-SCDMA Long Term Evolution integrated testing platform; data acquisition system; downlink link processing; large-capacity uplink data acquisition; multichannel buffered serial port interface; series Virtex 5; Data acquisition; Digital signal processing; Field programmable gate arrays; Instruments; Synchronization; Testing; Wireless communication; McBSP; TD-SCDMA Long Term Evolution; Virtex-5; data acquisition;

fLanguage

English

Publisher

ieee

Conference_Titel

Multimedia Technology (ICMT), 2011 International Conference on

Conference_Location

Hangzhou

Print_ISBN

978-1-61284-771-9

Type

conf

DOI

10.1109/ICMT.2011.6001989

Filename

6001989