Title :
Insights into the nonideal behavior of CdS/CdTe solar cells
Author :
McMahon, T.J. ; Fahrenbruch, A.L.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
One-dimensional device modeling (AMPS-1D) is used to understand and explain the departures from ideal behavior seen in CdS/Cd-Te solar cells, such as rollover and crossover of the dark and light J-V curves and shifts in Voc. Large variations of these departures occur from cell to cell and for the same cell after environmental stress. J-V curve rollover in the dark (and to some extent in the light in forward bias beyond Voc) is explained by the inclusion of a blocking contact at the back, which limits majority-carrier injection. Crossover of light and dark J-V curves occurs because light can supply additional electron current through the cell in the rollover region, becoming the principal component of the total current at the back of the cell. Decreases in Voc occur for light doping, and/or compensation of dopant accepters by donor recombination centers, and/or thinner cells. The authors show that the back-contact energy barrier to holes influences cell characteristics far more than the same contact energy barrier to electrons at the front. Finally, rollover of a different type that occurs in the power quadrant is explained by the inclusion of a thin n-layer under the back-contact metal
Keywords :
II-VI semiconductors; cadmium compounds; electron-hole recombination; electronic engineering computing; semiconductor device models; semiconductor doping; software packages; solar cells; 1-D device modeling; AMPS-1D; CdS-CdTe; CdS-CdTe solar cells; back-contact energy barrier; blocking contact; computer simulation; crossover; dark J-V curves; donor recombination centers; dopant accepters compensation; doping; electron current; forward bias; light J-V curves; nonideal behavior; open circuit voltage shifts; power quadrant; rollover; Charge carrier processes; Current supplies; Dark current; Doping; Electrons; Energy barrier; Photovoltaic cells; Spontaneous emission; Stress; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915892