DocumentCode :
3028851
Title :
Modeling the cross-over of the I-V characteristics of thin film CdTe solar cells
Author :
Burgelman, M. ; Nollet, P. ; Degrave, S. ; Beier, J.
Author_Institution :
Ghent Univ., Belgium
fYear :
2000
fDate :
2000
Firstpage :
551
Lastpage :
554
Abstract :
The I-V curves of high efficiency CdTe thin film solar cells show a kink in the forward region (roll-over) this fact is well studied and ascribed to a contact barrier e.g. at the back contact of the CdTe layer. Also, light and dark I-V characteristics intersect (cross-over), due to an increase of the contact saturation current under illumination. We observed on many occasions that a fan of several I-V curves all intersect at one single point in the first quadrant (forward current and voltage), when some parameter is varied, like illumination intensity or minimal changes of processing conditions. We ascribe this to the contribution of electron minority current at the CdTe back contact Schottky barrier. We show how this can explain the one-point-intersection. The validity of the assumptions are discussed with theoretical considerations, numerical simulations and experiments
Keywords :
II-VI semiconductors; Schottky barriers; cadmium compounds; electrical contacts; semiconductor thin films; solar cells; CdTe; CdTe back contact Schottky barrier; CdTe layer; CdTe thin film solar cells; I-V characteristics; I-V curves; back contact; contact barrier; contact saturation current; cross-over modeling; dark I-V characteristics; electron minority current; forward current; forward region; forward voltage; high efficiency; illumination intensity; light I-V characteristics; minimal changes; numerical simulations; one-point-intersection; processing conditions; thin film CdTe solar cells; Aging; Circuits; Electrons; Lighting; Numerical simulation; Photovoltaic cells; Schottky barriers; Schottky diodes; Transistors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.915896
Filename :
915896
Link To Document :
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