Title :
Temperature and illumination dependent junction transport in CdTe-CdS solar cells
Author :
Linam, D.L. ; Lush, G.B. ; Dils, D.W. ; Singh, V.P. ; McClure, J.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., El Paso, TX, USA
Abstract :
Various electrical and optical techniques have been used to study junction transport mechanisms in CdTe-CdS solar cells. Current density versus voltage (J-V) characteristics were measured at various temperatures under various broad-spectrum illumination intensities, under visible wavelength monochromatic illumination, and under infrared (IR) illumination. The broad-spectrum J-V data was fit to a parallel diode model in order to extract diode parameters. Analysis reveals the existence of two junction transport mechanisms. The first is an intensity-independent recombination process, dominant at high bias levels under low illumination intensity. The second is a tunneling transport mechanism, dominant at low bias levels under high illumination intensities, with an intensity-dependent reverse saturation current. A physical model is presented that explains the observed behavior
Keywords :
II-VI semiconductors; cadmium compounds; current density; electron-hole recombination; p-n heterojunctions; solar cells; CdTe-CdS; CdTe-CdS solar cells; broad-spectrum J-V data; broad-spectrum illumination intensities; current density versus voltage characteristics; diode parameters extraction; electrical techniques; high bias levels; high illumination intensities; illumination dependent junction transport; infrared illumination; intensity-dependent reverse saturation current; intensity-independent recombination process; junction transport mechanisms; low bias levels; low illumination intensity; optical techniques; parallel diode model; temperature dependent junction transport; tunneling transport mechanism; visible wavelength monochromatic illumination; Current density; Current measurement; Density measurement; Diodes; Lighting; Optical saturation; Photovoltaic cells; Temperature dependence; Temperature measurement; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915898