Title :
X-ray crystal density study on a FZ silicon crystal for the determination of the Avogadro constant
Author :
Tanaka, Mitsuru ; Fujii, Kenichi ; Nezu, Y. ; Nakayama, Keisuke ; Fujimoto, Hiroshi ; Gonnda, S. ; De Bievre, P. ; Valkiers, S. ; Toy, Y.
Author_Institution :
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Abstract :
The systematic errors for the determination of the Avogadro constant using a FZ silicon ingot for NRLM are analyzed by studying the silica layer on the surface, macroscopic and microscopic defect in the body, of the sphere and concluded Avogadro constant shows the discrepancies around 3ppm to previously reported numbers.
Keywords :
X-ray diffraction; constants; density measurement; silicon; Avogadro constant; FZ silicon crystal; Si; X-ray crystal density; defects; sphere; surface silica layer; systematic error; Building materials; Chemical analysis; Chemical elements; Density measurement; Error correction; Laboratories; Lattices; Silicon compounds; X-ray detection; X-ray detectors;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546755
