• DocumentCode
    3029280
  • Title

    Influence of crystal orientation on device performance of CuInS2 solar cells

  • Author

    Siemer, K. ; Klaer, J. ; Luck, I. ; Bräunig, D.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    630
  • Lastpage
    633
  • Abstract
    CuInS2 based thin film solar cells are prepared by a rapid thermal process. X-ray diffraction on CuInS2 absorber layers show preferred (112) orientation for certain process parameters. The occurrence of this crystal orientation correlates with superior device performance of corresponding solar cells mainly due to a decreased series resistance. From admittance spectroscopy, these cells show higher absorber conductivity at low temperatures
  • Keywords
    X-ray diffraction; copper compounds; crystal orientation; indium compounds; semiconductor device measurement; semiconductor device testing; solar cells; spectroscopy; ternary semiconductors; CuInS2; CuInS2 absorber layers; CuInS2 solar cells; X-ray diffraction; absorber conductivity; admittance spectroscopy; crystal orientation; device performance; preferred (112) orientation; process parameters; series resistance reduction; Admittance measurement; Conductivity; Etching; Furnaces; Photovoltaic cells; Powders; Rapid thermal processing; Spectroscopy; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915922
  • Filename
    915922