DocumentCode :
3029588
Title :
Build risk probability distribution maps based on DPAW Copula during wake encountering
Author :
Xue Yuan ; Wang Xiao-long ; Xu Hao-jun
Author_Institution :
Aeronaut. & Astronaut. Eng. Coll., Air Force Eng. Univ., Xi´an, China
fYear :
2013
fDate :
20-22 Dec. 2013
Firstpage :
2991
Lastpage :
3001
Abstract :
Flight risk probabilities during wake encountering were studied. First, two-dimensional extreme flight parameters required for assessing the risk are extracted based on Monte Carlo method. Second, the DPAW (Double Parameters & Adaptive Weights) Copula is proposed for modeling the distributions of two-dimensional extreme parameters. The results of fitting test show DPAW Copula has the highest accuracy in all Copulas. Finally the 2D and 3D distribution maps of visual flight risk probabilities are constructed. The topology characteristics of the flight risk probability distributions are analyzed. The maximum flight risk probability during close wake encountering is about 13.5%. The work is an effective complement to assessment theory and methods of aircraft system safety. It also has some reference values for research directions such as wake navigation control, risk aversion, airport safety interval improvement, visualization of environmental risks.
Keywords :
Monte Carlo methods; aerospace safety; aircraft; risk management; statistical distributions; wakes; 2D distribution map visual flight risk probability; 3D distribution map visual flight risk probability; DPAW copula; Monte Carlo method; aircraft system safety; double parameters & adaptive weight copula; flight risk probability distribution topology characteristics; risk probability distribution maps; two-dimensional extreme flight parameter distribution; wake encountering; Analytical models; Hidden Markov models; Navigation; Solid modeling; Three-dimensional displays; DPAW Copula; Monte Carlo method; distribution maps; extreme parameters; flight risk probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location :
Shengyang
Print_ISBN :
978-1-4799-2564-3
Type :
conf
DOI :
10.1109/MEC.2013.6885541
Filename :
6885541
Link To Document :
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