Title :
Atomic force microscopy for industry with the Akiyama-Probe sensor
Author :
Stücklin, Stephan ; Gullo, Maurizio R. ; Akiyama, Terunobu ; Scheidiger, Martin
Author_Institution :
Nanosurf AG, Liestal
Abstract :
For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been integrated in a commercial AFM to significantly simplify probe exchange.
Keywords :
atomic force microscopy; probes; sensors; AFM; Akiyama-probe sensor; atomic force microscopy; industry; probe exchange; Atomic force microscopy; Feedback loop; Force sensors; Industry applications; Manufacturing industries; Probes; Surface finishing; Surface topography; Tunneling; Vibrations; Akiyama-Probe; atomic force microscopy; ease of use; industry; quartz tuning fork;
Conference_Titel :
Nanoscience and Nanotechnology, 2008. ICONN 2008. International Conference on
Conference_Location :
Melbourne, Vic.
Print_ISBN :
978-1-4244-1503-8
Electronic_ISBN :
978-1-4244-1504-5
DOI :
10.1109/ICONN.2008.4639250
