Title :
Stabilized 9% efficiency of large-area (~5000cm2) a-Si/a-SiGe tandem submodules using high-rate deposition
Author :
Okamoto, S. ; Terakawa, A. ; Maruyama, E. ; Shinohara, W. ; Hishikawa, Y. ; Kiyama, S.
Author_Institution :
New Mater. Res. Centre, Sanyo Electr. Co. Ltd., Osaka, Japan
Abstract :
High-rate deposition of photovoltaic layers of a-Si/a-SiGe tandem solar cells has been investigated using RF (13.56 MHz) plasma-CVD method while keeping the substrate temperature below 200°C. A remarkable improvement in film quality and device performance can be attained at a high deposition rate of ⩾3 Å/s by optimizing hydrogen dilution and other deposition conditions. It is of great importance to utilize the effect of hydrogen dilution which can reduce the incorporation of excess hydrogen in the films. The world´s highest stabilized efficiency of 9.3% has been achieved for a large-area (5150cm2) a-Si/a-SiGe tandem submodule whose top and bottom photovoltaic layers are deposited at ~3 Å/s using an optimized hydrogen dilution. A smart back reflector, with a high light scattering effect, and other approaches to enhance the optical confinement effect, are also proposed for further improvement of cell performance
Keywords :
Ge-Si alloys; amorphous semiconductors; elemental semiconductors; plasma CVD; plasma CVD coatings; semiconductor device measurement; semiconductor device testing; semiconductor thin films; silicon; solar cells; 13.56 MHz; 9.3 percent; RF plasma CVD method; Si-SiGe; a-Si/a-SiGe tandem solar cells; deposition conditions; device performance; film quality; high-rate deposition; hydrogen dilution; light scattering effect; optical confinement effect; photovoltaic layers; photovoltaic performance improvement; smart back reflector; substrate temperature; Hydrogen; Light scattering; Optical films; Photovoltaic cells; Photovoltaic systems; Plasma devices; Plasma temperature; Radio frequency; Solar power generation; Substrates;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915989