Deconvolution of ultrasonic NDT signals using N4SID algorithm for defect identification

Author

Qidwai, Uvais ; Bettayeb, Maamur

Author_Institution

Electr. Eng. & Comput. Sci. Dept., Tulane Univ., New Orleans, LA, USA

Volume

1

fYear

2003

fDate

14-17 Dec. 2003

Firstpage

60

Abstract

Subspace identification is considered to be one of the most powerful techniques in the system identification domain. In this paper, an application of a powerful version of subspace identification, N4SID, is presented. The target area is ultrasonic A-scans for defect detection in metals. Simulated as well as real data sets have been used for testing. Since the A-scans are a very commonly used form of analysis signals for nondestructive testing (NDT), their analysis is very useful for determining the type and severity of defect.

Keywords

acoustic signal processing; deconvolution; flaw detection; identification; ultrasonic materials testing; N4SID algorithm; analysis signals; deconvolution; defect identification; defect severity; metal defects; nondestructive testing; real data sets; simulated data sets; subspace identification; system identification domain; target area; ultrasonic A-scans; ultrasonic NDT signals; Additive noise; Deconvolution; Pulse measurements; Signal analysis; Signal generators; Signal processing; Signal to noise ratio; System identification; Transfer functions; Ultrasonic variables measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on

Print_ISBN

0-7803-8163-7

Type

conf

DOI

10.1109/ICECS.2003.1301976

Filename

1301976