Title :
Deconvolution of ultrasonic NDT signals using N4SID algorithm for defect identification
Author :
Qidwai, Uvais ; Bettayeb, Maamur
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Tulane Univ., New Orleans, LA, USA
Abstract :
Subspace identification is considered to be one of the most powerful techniques in the system identification domain. In this paper, an application of a powerful version of subspace identification, N4SID, is presented. The target area is ultrasonic A-scans for defect detection in metals. Simulated as well as real data sets have been used for testing. Since the A-scans are a very commonly used form of analysis signals for nondestructive testing (NDT), their analysis is very useful for determining the type and severity of defect.
Keywords :
acoustic signal processing; deconvolution; flaw detection; identification; ultrasonic materials testing; N4SID algorithm; analysis signals; deconvolution; defect identification; defect severity; metal defects; nondestructive testing; real data sets; simulated data sets; subspace identification; system identification domain; target area; ultrasonic A-scans; ultrasonic NDT signals; Additive noise; Deconvolution; Pulse measurements; Signal analysis; Signal generators; Signal processing; Signal to noise ratio; System identification; Transfer functions; Ultrasonic variables measurement;
Conference_Titel :
Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on
Print_ISBN :
0-7803-8163-7
DOI :
10.1109/ICECS.2003.1301976
