DocumentCode
3030435
Title
High rate deposition of silicon thin films by hot wire cell method for solar cell applications
Author
Konagai, M. ; Tsushima, T. ; Ide, Y. ; Asakusa, K. ; Fujisaki, T. ; Kim, M.K. ; Wakita, Y. ; Yamada, A.
Author_Institution
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
fYear
2000
fDate
2000
Firstpage
788
Lastpage
791
Abstract
Hot wire cell method has been newly developed and successfully applied to grow polycrystalline and amorphous Si thin films with relatively high growth rates of 0.4-2.0 nm/s. It is found that polycrystalline Si films can be obtained at substrate temperatures of 175-400°C without a hydrogen dilution when the filament temperature is 2000-2100°C. Valency control has been carried out by using of PH 3 and B2H6. Up to now, high conductivities of 13 S/cm and 4 S/cm have been achieved for n-type and p-type polycrystalline Si thin films, respectively. Polycrystalline Si and a-Si solar cells prepared with the deposition rates of 0.4-1.0 nm/s showed the efficiencies of ~1% and 4.3%, respectively. We found by SIMS analysis that the high concentration of O and C atoms is incorporated into the film which limits the present cell performances
Keywords
chemical vapour deposition; elemental semiconductors; mass spectroscopic chemical analysis; secondary ion mass spectra; semiconductor growth; semiconductor thin films; silicon; solar cells; 175 to 400 degC; 2000 to 2100 degC; SIMS analysis; Si; deposition rates; efficiencies; filament temperature; growth rates; high conductivities; high rate deposition; hot wire cell method; n-type; p-type; polycrystalline Si films; polycrystalline Si thin films; silicon thin films; solar cell applications; substrate temperatures; valency control; Amorphous materials; Conductivity; Hydrogen; Semiconductor films; Semiconductor thin films; Silicon; Sputtering; Substrates; Temperature; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.916001
Filename
916001
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