Title :
High rate deposition of silicon thin films by hot wire cell method for solar cell applications
Author :
Konagai, M. ; Tsushima, T. ; Ide, Y. ; Asakusa, K. ; Fujisaki, T. ; Kim, M.K. ; Wakita, Y. ; Yamada, A.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
Hot wire cell method has been newly developed and successfully applied to grow polycrystalline and amorphous Si thin films with relatively high growth rates of 0.4-2.0 nm/s. It is found that polycrystalline Si films can be obtained at substrate temperatures of 175-400°C without a hydrogen dilution when the filament temperature is 2000-2100°C. Valency control has been carried out by using of PH 3 and B2H6. Up to now, high conductivities of 13 S/cm and 4 S/cm have been achieved for n-type and p-type polycrystalline Si thin films, respectively. Polycrystalline Si and a-Si solar cells prepared with the deposition rates of 0.4-1.0 nm/s showed the efficiencies of ~1% and 4.3%, respectively. We found by SIMS analysis that the high concentration of O and C atoms is incorporated into the film which limits the present cell performances
Keywords :
chemical vapour deposition; elemental semiconductors; mass spectroscopic chemical analysis; secondary ion mass spectra; semiconductor growth; semiconductor thin films; silicon; solar cells; 175 to 400 degC; 2000 to 2100 degC; SIMS analysis; Si; deposition rates; efficiencies; filament temperature; growth rates; high conductivities; high rate deposition; hot wire cell method; n-type; p-type; polycrystalline Si films; polycrystalline Si thin films; silicon thin films; solar cell applications; substrate temperatures; valency control; Amorphous materials; Conductivity; Hydrogen; Semiconductor films; Semiconductor thin films; Silicon; Sputtering; Substrates; Temperature; Wire;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916001