Title :
Improvement in the conversion efficiency of single and double junction a-Si solar cells by using high quality p-SiO:H window layer and seed layer/thin n-μc-Si:H layer
Author :
Barua, A.K. ; Sarker, Arindam ; Bandyopadhyay, A.K. ; Das, Debajyoti ; Ray, Swati
Author_Institution :
Energy Res. Unit, Indian Assoc. for the Cultivation of Sci., Calcutta, India
Abstract :
The authors have developed high quality p-type amorphous and microcrystalline SiO:H films by the RF-PECVD method (13.56 MHz) at deposition conditions suitable for use in the fabrication of a-Si solar cells. Previously, they have developed seed layer/thin n-μc-Si:H bilayer which reduces significantly the minimum required thickness of n-μc-Si:H layer. By using these materials they have been able to improve the conversion efficiency of single and double junction (a-Si/a-Si) a-Si solar cells. For single junction cells (1.0 cm2 ) the initial efficiency achieved to date is 11.6% (Voc=0.91 V, Jsc=17.7 mA/cm2 and F.F.=0.72). It is about 1% higher than that achieved with p-a-SiC:H as the window layer. For double junction cells, the initial efficiency achieved is 11.8% (Voc=1.74 V, Jsc=8.9 mA/cm2 and F.F.=0.76). There is further scope for achieving higher efficiencies by improving material characteristics and interfaces
Keywords :
amorphous semiconductors; elemental semiconductors; hydrogen; plasma CVD; plasma CVD coatings; semiconductor doping; semiconductor thin films; silicon; silicon compounds; solar cells; 0.91 V; 1.74 V; 11.6 percent; 11.8 percent; 13.56 MHz; RF-PECVD method; Si; Si:H; SiO:H; a-Si solar cells; conversion efficiency improvement; deposition conditions; fabrication; high quality p-SiO:H window layer; interfaces; material characteristics; seed layer/thin n-μc-Si:H layer; Amorphous materials; Buffer layers; Conducting materials; Conductive films; Conductivity; Fabrication; Mass production; Photovoltaic cells; Vacuum systems; Wideband;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916011