The Study of the Far Field Test System Based on Scanning Method

Author

Haiying Yu ; Lin Suo ; Meikai Su ; Xiaoning Yuan ; Qi Li ; Qian Wei

Author_Institution

Shandong Provincial Key Lab. of Intell. Buildings Technol., Shandong Jianzhu Univ., Jinan, China

fYear

2013

fDate

29-30 June 2013

Firstpage

1570

Lastpage

1572

Abstract

The far field reflects the LD beam intensity distribution on the space geometry. This article mainly aims at the disadvantage of high cost which exist in the traditional LD far field test, the scanning method is found with 51 microcomputer, the 51 microcomputer controls level and vertical motors driving laser and photoelectric detector, laser rotate some angle, photoelectric detector and scan 180°, and combined with MATLAB software, the 3D light intensity distribution of LD will be drawn, so as to complete the far field test of LD, Comparison between test results with scanning method and the CCD testing method on the far field, the results are basically identical.

Keywords

automatic test equipment; laser beams; microprocessor chips; motor drives; optical engineering computing; photodetectors; photoelectric devices; semiconductor lasers; 3D light intensity distribution; LD beam intensity distribution; MATLAB software; far field test system; microcomputer controls; motor driver module; photoelectric detector; scanning method; semiconductor laser; space geometry; vertical motors; Automation; Manufacturing; CCD; Far Field Test; LD; Scanning Method;

fLanguage

English

Publisher

ieee

Conference_Titel

Digital Manufacturing and Automation (ICDMA), 2013 Fourth International Conference on

Conference_Location

Qingdao

Type

conf

DOI

10.1109/ICDMA.2013.376

Filename

6598300