Title :
A 40nm CMOS, 1.27nJ, 330mV, 600kHz, Bose Chaudhuri Hocquenghem 252 bits frame decoder
Author :
Clerc, Sylvain ; Abouzeid, Fady ; Heinrich, Vincent ; Jain, Abhishek ; Veggetti, Andrea Mario ; Crippa, Dennis ; Roche, Philippe ; Sicard, Gilles
Abstract :
Following the will to answer to the energy constrained applications requirements, an Ultra-Low Voltage (ULV) 40nm Bose-Chaudhuri-Hocquenghem (BCH) error-correcting circuit is presented. Mapped on a ULV specific standard cells library, the circuit was designed following standard industrial implementation and verification flows. The BCH circuit runs at 0.330V, 600kHz frequency and needs 1.27nJ to decode a 252bits frame. With 14% of extra power compared to typical process, applying forward bias enables to compensate temperature and skewed process effects, regaining 150mV minimum operating voltage.
Keywords :
BCH codes; CMOS analogue integrated circuits; integrated circuit design; Bose Chaudhuri Hocquenghem; Bose-Chaudhuri-Hocquenghem error-correcting circuit; CMOS; ULV specific standard cells library; frame decoder; frequency 600 kHz; size 40 nm; verification flows; voltage 330 mV; Automatic testing; CMOS technology; Circuit testing; Decoding; Delay; Frequency measurement; Libraries; Low voltage; Measurement standards; Silicon; 40nm CMOS Digital circuit design; Low Power; Ultra Low Voltage;
Conference_Titel :
IC Design and Technology (ICICDT), 2010 IEEE International Conference on
Conference_Location :
Grenoble
Print_ISBN :
978-1-4244-5773-1
DOI :
10.1109/ICICDT.2010.5510284
