DocumentCode :
3031122
Title :
Effects of inductance on the propagation delay and repeater insertion in VLSI circuits
Author :
Ismail, Yehea I. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
fYear :
1999
fDate :
1999
Firstpage :
721
Lastpage :
724
Abstract :
A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range of RLC loads. It is shown that the traditional quadratic dependence of the propagation delay on the length of an RC line approaches a linear dependence as inductance effects increase. The closed form delay model is applied to the problem of repeater insertion in RLC interconnect. Closed form solutions are presented for inserting repeaters into RLC lines that are highly accurate with respect to numerical solutions. An RC model as compared to an RLC model creates errors of up to 30% in the total propagation delay of a repeater system. Considering inductance in repeater insertion is also shown to significantly save repeater area and power consumption. The error between the RC and RLC models increases as the gate parasitic impedances decrease which is consistent with technology scaling trends. Thus, the importance of inductance in high performance VLSI design methodologies will increase as technologies scale
Keywords :
CMOS digital integrated circuits; VLSI; delay estimation; inductance; integrated circuit design; integrated circuit interconnections; CMOS gate; RC line; RLC interconnect; RLC loads; VLSI circuits; closed form delay model; closed form expression; distributed RLC line; gate parasitic impedances; high performance VLSI design methodologies; inductance effects; power consumption; propagation delay; repeater area reduction; repeater insertion; technology scaling; Circuit simulation; Closed-form solution; Energy consumption; Impedance; Inductance; Integrated circuit interconnections; Power system modeling; Propagation delay; Repeaters; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
Type :
conf
DOI :
10.1109/DAC.1999.782051
Filename :
782051
Link To Document :
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