GEANT4 analysis of n-Si nuclear reactions from different sources of neutrons and its implication on soft-error rate

This work examines nuclear events resulting from the interaction of atmospheric neutrons at ground level and different synthetic (i.e. atmospheric-like) sources with a silicon layer. Using extensive GEANT4 simulations and in-depth data analysis, this study provides an accurate and fine comparison between several facilities, mono-energetic tests and natural environment in terms of nuclear processes, secondary ion production and fragment energy distribution. The different computed databases have been used in a second part of this work to estimate the soft-error rate of a widely characterized 65nm SRAM test circuit with the Tool suite for rAdiation Reliability Assessment (TIARA Monte-Carlo simulation code). A detailed analysis is conducted to clarify the mechanisms leading to both single and multiple cell upsets.