DocumentCode :
3031856
Title :
Evaluation of multijunction solar cell performance in radiation environments
Author :
Marvin, Dean C. ; Nocerino, John C.
Author_Institution :
Aerosp. Corp., Albuquerque, NM, USA
fYear :
2000
fDate :
2000
Firstpage :
1102
Lastpage :
1105
Abstract :
This report contains the results of the first systematic radiation study of five types of production multijunction solar cells. Cells optimized for beginning of life (BOL) efficiency were developed and obtained under the Air Force Manufacturing Technology (ManTech) program. These included GaInP2/GaAs two junction cells from Spectrolab, and GaInP2/GaAs/Ge three junction cells from both Spectrolab and TECSTAR. Additional two junction cells optimized for end of life (EOL) efficiency were obtained from Spectrolab. Radiation test data on EOL-optimized three junction cells were provided by Spectrolab. For all cell types I-V characteristics were obtained as a function of radiation fluence using electrons (0.6, 1.0, and 1.6 MeV) and protons (0.05, 0.1, 0.2, 0.4, 1.0, 5.0, and 10 MeV). From these data, omnidirectional damage coefficients were calculated, assuming infinite backshielding and eight different coverglass thicknesses
Keywords :
III-V semiconductors; electron beam effects; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; p-n heterojunctions; proton effects; solar cells; space vehicle power plants; 0.05 to 10 MeV; Air Force Manufacturing Technology program; GaInP2-GaAs; GaInP2-GaAs-Ge; GaInP2/GaAs two junction cells; GaInP2/GaAs/Ge three junction cells; Spectrolab; TECSTAR; beginning of life efficiency; coverglass thicknesses; electrons; end of life efficiency; infinite backshielding; multijunction solar cell performance; omnidirectional damage coefficients; protons; radiation environments; radiation fluence; radiation test data; space solar cells; Degradation; Electrons; Gallium arsenide; Manufacturing; Optimized production technology; Photovoltaic cells; Production systems; Protons; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916079
Filename :
916079
Link To Document :
بازگشت