• DocumentCode
    303186
  • Title

    Reduction of voltage stress in charge pump electronic ballast

  • Author

    Chen, Wei ; Lee, Fred C. ; Yamauchi, Tokushi

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    23-27 Jun 1996
  • Firstpage
    887
  • Abstract
    The charge pump electronic ballast circuit, which employs a charging capacitor and a high frequency AC source to implement the power factor correction (PFC), has become an attractive topology for ballasting the fluorescent lamps because it eliminates the use of a bulky boost inductor. But this circuit has the problem of high voltage stress at light load operations especially during the preheat and startup operations of the lamps. Based on the analysis of the operation principle, the following solution was proposed. With the introduction of a second resonance stage, the voltage stress in this ballast was reduced by half. The experimental results are provided for verification
  • Keywords
    capacitors; fluorescent lamps; lamp accessories; power convertors; power factor correction; charge pump electronic ballast; fluorescent lamps; high frequency AC source; light load; power factor correction; preheat operation; resonance stage; startup operation; voltage stress reduction; Capacitors; Charge pumps; Circuit topology; Electronic ballasts; Fluorescent lamps; Frequency; Inductors; Power factor correction; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE
  • Conference_Location
    Baveno
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-3500-7
  • Type

    conf

  • DOI
    10.1109/PESC.1996.548686
  • Filename
    548686