DocumentCode
303186
Title
Reduction of voltage stress in charge pump electronic ballast
Author
Chen, Wei ; Lee, Fred C. ; Yamauchi, Tokushi
Author_Institution
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume
1
fYear
1996
fDate
23-27 Jun 1996
Firstpage
887
Abstract
The charge pump electronic ballast circuit, which employs a charging capacitor and a high frequency AC source to implement the power factor correction (PFC), has become an attractive topology for ballasting the fluorescent lamps because it eliminates the use of a bulky boost inductor. But this circuit has the problem of high voltage stress at light load operations especially during the preheat and startup operations of the lamps. Based on the analysis of the operation principle, the following solution was proposed. With the introduction of a second resonance stage, the voltage stress in this ballast was reduced by half. The experimental results are provided for verification
Keywords
capacitors; fluorescent lamps; lamp accessories; power convertors; power factor correction; charge pump electronic ballast; fluorescent lamps; high frequency AC source; light load; power factor correction; preheat operation; resonance stage; startup operation; voltage stress reduction; Capacitors; Charge pumps; Circuit topology; Electronic ballasts; Fluorescent lamps; Frequency; Inductors; Power factor correction; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE
Conference_Location
Baveno
ISSN
0275-9306
Print_ISBN
0-7803-3500-7
Type
conf
DOI
10.1109/PESC.1996.548686
Filename
548686
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