DocumentCode
3032060
Title
Optimal wavelet features for an infrared satellite precipitation estimate algorithm
Author
Mahrooghy, Majid ; Anantharaj, Valentine G. ; Younan, Nicolas H. ; Aanstoos, James
Author_Institution
Dept. of Electr. Eng., Mississippi State Univ., Mississippi State, MS, USA
fYear
2010
fDate
13-15 Oct. 2010
Firstpage
1
Lastpage
6
Abstract
A satellite precipitation estimation algorithm based on wavelet features is investigated to find the optimal wavelet features in terms of wavelet family and sliding window size. In this work, the infrared satellite based images along with ground gauge (radar corrected) observations are used for the retrieval rainfall. The goal of this work is to find an optimal wavelet transform to represent better features for cloud classification and rainfall estimation. Our approach involves the following four steps: 1) segmentation of infrared cloud images into patches; 2) feature extraction using a wavelet-based method; 3) clustering and classification of cloud patches using neural network, and 4) dynamic application of brightness temperature (Tb) and rain rate relationships, derived using satellite observations. The results show that Haar and Symlet wavelets with sliding window size 5×5 have better estimate performance than other wavelet families and window sizes.
Keywords
Haar transforms; clouds; feature extraction; geophysical image processing; image classification; image segmentation; infrared imaging; neural nets; pattern clustering; precipitation; rain; wavelet transforms; Haar wavelet; Symlet wavelet; brightness temperature; cloud classification; cloud patch classification; cloud patch clustering; feature extraction; ground gauge; infrared cloud image segmentation; infrared satellite based imaging; infrared satellite precipitation estimation algorithm; neural network; optimal wavelet feature; rain rate relationship; rainfall estimation; retrieval rainfall; sliding window size; wavelet family; Clouds; Estimation; Feature extraction; Pixel; Rain; Satellites; Wavelet transforms; clustering methods; curve fitting; feature extraction; neural networks; wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop (AIPR), 2010 IEEE 39th
Conference_Location
Washington, DC
ISSN
1550-5219
Print_ISBN
978-1-4244-8833-9
Type
conf
DOI
10.1109/AIPR.2010.5759702
Filename
5759702
Link To Document