Title :
CARMEN-2: In flight observation of non destructive single event phenomena on memories
Author :
Samaras, Anne ; Bezerra, Françoise ; Lorfevre, Eric ; Ecoffet, Robert
Author_Institution :
Centre Nat. d´´Etudes Spatiales, Toulouse, France
Abstract :
This paper presents non destructive SEE data collected in flight on commercial SRAMs, SSRAMs and SDRAMs by MEX module. Detected events are SEU, MCU, SEFI as well as weakened cell. MEX (Module Experience) is a part of CARMEN2 instrument, launched the 22th of June 2008 aboard JASON2 satellite (1335km, 66°). This scientific instrument is dedicated to the study of space radiation effects on electronic devices.
Keywords :
DRAM chips; SRAM chips; microcontrollers; modules; radiation effects; CARMEN2 instrument; JASON2 satellite; MCU; MEX module; SDRAM; SEFI; SEU; SRAM; SSRAM; distance 1335 km; electronic device; flight observation; module experience; nondestructive SEE data collection; space radiation effect; Cyclotrons; Instruments; Protons; SDRAM; Single event upset; CARMEN2; MCU; SEE; SEFI; SEU; memory sensitive; protons; weakened cell;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131314
