Title :
Dose rate radiation induced linear CCD functional failure
Author :
Zujun Wang ; Bengqi Tang ; Zhigang Xiao ; Minbo Liu ; Yong Zhang ; Shaoyan Huang
Author_Institution :
Northwest Inst. of Nucl. Technol., Xi´an, China
Abstract :
The experiments of different dose rate radiation induced Charge Coupled Devices (CCD) functional failure are presented. The CCDs are divided into three groups with no shielding, shielding the output amplifiers, and shielding the photo sensing and the shift register areas with Pb during 60Co γ tests. The radiation tolerance depend on the dose rates whether the linear CCDs are shielded or not. The total doses to functional failure of the CCDs at different dose rate radiation are compared. The criterion of functional failure induced by ionization radiation is ascertained. The mechanism of CCD functional failure is analyzed.
Keywords :
charge-coupled devices; failure analysis; ionisation; radiation hardening (electronics); shielding; amplifier shielding; dose rate radiation induced charge coupled devices functional failure; dose rate radiation induced linear CCD functional failure; photo sensing shielding; radiation tolerance; shift register area shielding; Charge coupled devices; Ionization; Lead; Radiation effects; Sensors; Shift registers; Voltage measurement; Charge coupled devices; Dose rate; Functional failure; Total dose;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131316
